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(English)Manuscript (preprint) (Other academic)
Abstract [en]
Radiation damage is a topic since the dawn of X-ray crystallography, and has gained new importance in the era of X-ray free-electron lasers (XFELs), due to their unprecedented brilliance and pulse duration. One of the driving questions has been how short the XFEL pulse has to be for the structural information to be ”damage free”. Here we compare data from Serial Femtosecond Crystallography (SFX) experiments conducted with a 3 fs and a 10 fs X-ray pulse. We conclude that even if the estimated displacement of atoms in the sample is an order of magnitude larger in the case of the 10 fs experiment, the displacement is still too small to affect the experimental data at a resolution relevant for structural determination.
National Category
Atom and Molecular Physics and Optics
Identifiers
urn:nbn:se:uu:diva-519591 (URN)
Projects
In thesis
Funder
Swedish Research Council, 2018-00740, 2019-03935
2024-01-082024-01-082024-01-18