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Resonant inelastic soft-X-ray scattering at the 4d edge of Ce-based heavy-fermion materials
Uppsala University.
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1999 (English)In: JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, ISSN 0368-2048, Vol. 103, p. 783-786Article in journal (Other scientific) Published
Abstract [en]

Resonant X-ray scattering measurements were performed on CeB6, CeAl, gamma-Ce, and alpha-Ce at various incident-photon energies near the Ce 4d threshold. A pronounced inelastic scattering structure which has 4f character is observed at about 4 eV below th

Place, publisher, year, edition, pages
1999. Vol. 103, p. 783-786
Keywords [en]
Resonant soft-X-ray scattering; Ce-based heavy-fermion systems; charge-transfer excitations; X-ray absorption; SPECTROSCOPY; EXCITATIONS; MODEL
Identifiers
URN: urn:nbn:se:uu:diva-67073OAI: oai:DiVA.org:uu-67073DiVA, id: diva2:94984
Note
Addresses: Butorin SM, Univ Uppsala, Dept Phys, Box 530, S-75121 Uppsala, Sweden. Univ Uppsala, Dept Phys, S-75121 Uppsala, Sweden. Lawrence Berkeley Lab, Div Chem Sci, Berkeley, CA 94720 USA. Tohoku Univ, Dept Phys, Sendai, Miyagi 98077, Japan.Available from: 2006-11-08 Created: 2006-11-08 Last updated: 2013-10-10
In thesis
1. Electronic structure studies using resonant X-ray and photoemission spectroscopy
Open this publication in new window or tab >>Electronic structure studies using resonant X-ray and photoemission spectroscopy
1999 (English)Doctoral thesis, comprehensive summary (Other academic)
Abstract [en]

This thesis addresses the electronic structure of molecules and solids using resonant X-ray emission and photoemission spectroscopy. The use of monochromatic synchrotron radiation and the improved performance of the instrumentation have opened up the possibility of detailed analyses of the response of the electronic systems under interaction with X-rays. The experimental studies are accompanied by numerical ab initio calculations in the formalism of resonant inelastic scattering. The energy selectivity has made it possible for the first time to study how the chemical bonds in a molecule break up during resonant inelastic X-ray scattering. In the conjugated polymer systems, the element selectivity of the X-ray emission process made it possible to probe the different atomic elements separately. The X-ray emission technique proved to be useful for extracting isomeric information, and for measuring the change in the valence levels at different degrees of doping. In this thesis, spectral satellite features in transition metals were thoroughly investigated for various excitation energies around a core-level threshold. By measuring the relative spectral intensity of the satellites it was possible to extract information on the partial core-level widths. Using the nickel metal system as an example, it was shown that it is possible to probe the different core-excited states close toshake-up thresholds by measuring the relative spectral intensity variation of the Auger emission.Resonant photoemission measurements showed unambiguous evidence of interference effects. Theseeffects were also thoroughly probed using angle-dependent measurements. The combination of X-rayemission and absorption were useful for studying buried layers and interfaces due to the appreciable penetration depth of soft X-rays. X-ray scattering was further found to be useful for studying low-energy excited states of rare earth metallic compounds and transition metal oxides.

Place, publisher, year, edition, pages
Uppsala: Acta Universitatis Upsaliensis, 1999. p. 95
Series
Comprehensive Summaries of Uppsala Dissertations from the Faculty of Science and Technology, ISSN 1104-232X ; 452
Keywords
Physics, Fysik
National Category
Physical Sciences
Research subject
Physics
Identifiers
urn:nbn:se:uu:diva-973 (URN)91-554-4463-6 (ISBN)
Public defence
1999-05-14, Siegbahn Lecture hall, Department of Physics, Uppsala University, Uppsala, 10:00
Available from: 1999-04-23 Created: 1999-04-23 Last updated: 2013-10-10Bibliographically approved

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Magnuson, MartinNordgren, J

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