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Growth dependent magnetization reversal in Co2MnAl full Heusler alloy thin films
Indian Inst Technol Delhi, Dept Phys, Thin Film Lab, New Delhi 110016, India..ORCID iD: 0000-0001-9445-5900
Indian Inst Technol Delhi, Dept Phys, Thin Film Lab, New Delhi 110016, India..
Uppsala University, Disciplinary Domain of Science and Technology, Technology, Department of Engineering Sciences, Solid State Physics. Indian Inst Technol Delhi, Dept Phys, Thin Film Lab, New Delhi 110016, India..
Indian Inst Technol Delhi, Dept Phys, Thin Film Lab, New Delhi 110016, India..
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2018 (English)In: Journal of Applied Physics, ISSN 0021-8979, E-ISSN 1089-7550, Vol. 123, no 5, article id 053901Article in journal (Refereed) Published
Abstract [en]

Angular dependent magnetization reversal has been investigated in Co2MnAl (CMA) full Heusler alloy thin films grown on Si(100) at different growth temperatures (T-s) by DC-magnetron sputtering. An M-shaped curve is observed in the in-plane angular (0 degrees-360 degrees) dependent coercivity (ADC) by magneto-optical Kerr effect measurements. The dependence of the magnetization reversal on Ts is investigated in detail to bring out the structure-property correlation with regards to ADC in these polycrystalline CMA thin films. This magnetization reversal (M-shaped ADC behavior) is well described by the two-phase model, which is a combination of Kondorsky (domain wall motion) and Stoner Wohlfarth (coherent rotation) models. In this model, magnetization reversal starts with depinning of domain walls, with their gradual displacement explained by the Kondorsky model, and at a higher field (when the domain walls merge), the system follows coherent rotation before reaching its saturation following the Stoner Wohlfarth model. Further, the analysis of angular dependent squareness ratio (M-r/M-s) indicates that our films clearly exhibited twofold uniaxial anisotropy, which is related to self-steering effect arising due to the obliquely incident flux during the film-growth.

Place, publisher, year, edition, pages
AMER INST PHYSICS , 2018. Vol. 123, no 5, article id 053901
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Condensed Matter Physics Engineering and Technology
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URN: urn:nbn:se:uu:diva-348378DOI: 10.1063/1.5004425ISI: 000424698200004OAI: oai:DiVA.org:uu-348378DiVA, id: diva2:1198590
Available from: 2018-04-18 Created: 2018-04-18 Last updated: 2018-04-18Bibliographically approved

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Behera, Nilamani

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