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Fabrication and characterization of highly reproducible, high resistance nanogaps made by focused ion beam milling
Uppsala universitet, Teknisk-naturvetenskapliga vetenskapsområdet, Tekniska sektionen, Institutionen för teknikvetenskaper, Tillämpad materialvetenskap.
Uppsala universitet, Teknisk-naturvetenskapliga vetenskapsområdet, Tekniska sektionen, Institutionen för teknikvetenskaper, Nanoteknologi och funktionella material.
Uppsala universitet, Teknisk-naturvetenskapliga vetenskapsområdet, Tekniska sektionen, Institutionen för teknikvetenskaper, Nanoteknologi och funktionella material.ORCID-id: 0000-0002-5496-9664
Uppsala universitet, Teknisk-naturvetenskapliga vetenskapsområdet, Tekniska sektionen, Institutionen för teknikvetenskaper, Tillämpad materialvetenskap.
Vise andre og tillknytning
2007 (engelsk)Inngår i: Nanotechnology, ISSN 0957-4484, E-ISSN 1361-6528, Vol. 18, nr 28, s. 285301-Artikkel i tidsskrift (Fagfellevurdert) Published
Abstract [en]

Nanoelectrodes were fabricated combining photolithography, electron beam lithography and focused ion beam milling allowing for large scale integration and nanoengineering of the electrode properties. The structure determination by transmission and scanning electron microscopy showed a highly reproducible gap width. The atomic scale electrode structure was characterized using scanning and transmission electron microscopy. The nanogap resistances were found to be the highest hitherto reported for nanogaps, namely in the 300–1300 TΩ range. Gold nanoparticles were trapped by ac dielectrophoresis, and the electrodes were shown to be stable enough to endure empty gap voltages as high as 5 V as well as currents high enough to induce fusing of trapped nanoparticles.

sted, utgiver, år, opplag, sider
2007. Vol. 18, nr 28, s. 285301-
HSV kategori
Forskningsprogram
Teknisk fysik med inriktning mot nanoteknologi och funktionella material
Identifikatorer
URN: urn:nbn:se:uu:diva-11214DOI: 10.1088/0957-4484/18/28/285301ISI: 000247619000001OAI: oai:DiVA.org:uu-11214DiVA, id: diva2:38982
Tilgjengelig fra: 2007-11-15 Laget: 2007-11-15 Sist oppdatert: 2019-04-24bibliografisk kontrollert
Inngår i avhandling
1. Fabrication and Applications of a Focused Ion Beam Based Nanocontact Platform for Electrical Characterization of Molecules and Particles
Åpne denne publikasjonen i ny fane eller vindu >>Fabrication and Applications of a Focused Ion Beam Based Nanocontact Platform for Electrical Characterization of Molecules and Particles
2010 (engelsk)Doktoravhandling, med artikler (Annet vitenskapelig)
Abstract [en]

The development of new materials with novel properties plays an important role in improving our lives and welfare. Research in Nanotechnology can provide e.g. cheaper and smarter materials in applications such as energy storage and sensors. In order for this development to proceed, we need to be able to characterize the material properties at the nano-, and even the atomic scale. The ultimate goal is to be able to tailor them according to our needs.

One of the great challenges concerning the characterization of nano-sized objects is how to achieve the physical contact to them. This thesis is focused on the contacting of nanoobjects with the aim of electrically characterizing them and subsequently understanding their electrical properties. The analyzed nanoobjects are carbon nanosheets, nanotetrapods, nanoparticles and molecular systems.

Two contacting strategies were employed in this thesis. The first strategy involved the development of a focused ion beam (FIB) based nanocontact platform. The platform consists of gold nanoelectrodes, having nanogaps of 10-30 nm, on top of an insulating substrate. Gold nanoparticles, double-stranded DNA and cadmium telluride nanotetrapods have been trapped in the gaps by using dielectrophoresis. In certain studies, the gold electrodes have also been coated with conducting or non-conducting molecules, prior to the trapping of gold nanoparticles, in order to form molecular junctions. These junctions were subsequently electrically characterized to evaluate the conduction properties of these molecular systems. For the purpose of better controlling the attachment of molecules to the nanoelectrodes, a novel route to synthesize alkanedithiol coated gold nanoparticles was developed. The second contacting strategy was based on the versatility of the FIB instrument as a platform for in-situ manipulation and electrical characterization of non-functionalized and functionalized carbon nanosheets, where it was found that the functionalized samples had an increased conductivity by more than one order of magnitude.

Both contacting strategies proved to be valuable for building knowledge around contacting and electrical characterization of nanoobjects

sted, utgiver, år, opplag, sider
Uppsala: Acta Universitatis Upsaliensis, 2010. s. 88
Serie
Digital Comprehensive Summaries of Uppsala Dissertations from the Faculty of Science and Technology, ISSN 1651-6214 ; 745
Emneord
Focused Ion Beam, FIB, Scanning Electron Microscopy, SEM, Nanogap electrodes, Nanostructuring, Nanofabrication, Electron Beam Lithography, Electrical characterization, Dielectrophoresis
Identifikatorer
urn:nbn:se:uu:diva-122940 (URN)978-91-554-7809-4 (ISBN)
Disputas
2010-06-07, Polhemsalen, Ångströmlaboratoriet, Lägerhyddsvägen 1, 75121, Uppsala, 10:15 (engelsk)
Opponent
Veileder
Tilgjengelig fra: 2010-05-17 Laget: 2010-04-21 Sist oppdatert: 2010-05-18bibliografisk kontrollert

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