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Stress and reliability of integrated RF-LDMOS transistors
Olsson, Jörgen
Uppsala University, Disciplinary Domain of Science and Technology, Technology, Department of Engineering Sciences, Solid State Electronics.
2015 (English)
In:
CSTIC, 2015
Conference paper, Oral presentation only (Refereed)
Place, publisher, year, edition, pages
2015.
National Category
Electrical Engineering, Electronic Engineering, Information Engineering
Research subject
Engineering Science with specialization in Electronics
Identifiers
URN:
urn:nbn:se:uu:diva-247360
OAI: oai:DiVA.org:uu-247360
DiVA, id:
diva2:796021
Conference
invited talk, CSTIC, Shanghai, March 15-16
Available from:
2015-03-17
Created:
2015-03-17
Last updated:
2015-07-02
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Olsson, Jörgen
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Solid State Electronics
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