Studies of resolidification of non-thermally molten InSb using time-resolved X-ray diffraction
2005 (English)In: APPLIED PHYSICS A: MATERIALS SCIENCE & PROCESSING, ISSN 0947-8396, Vol. 5, no 81, 893-900 p.Article in journal (Refereed) Published
We have used time-resolved X-ray diffraction to monitor the resolidification process of molten InSb. Melting was induced by an ultra-short laser pulse and the measurement conducted in a high-repetition-rate multishot experiment. The method gives direct information about the nature of the transient regrowth and permanently damaged layers. It does not rely on models based on surface reflectivity or second harmonic generation (SHG). The measured resolidification process has been modeled with a 1-D thermodynamic heat-conduction model. Important parameters like sample temperature, melting depth and amorphous surface layer thickness come directly out of the data, while mosaicity of the sample and free carrier density can be quantified by comparing with models. Melt depths up to 80 nm have been observed and regrowth velocities in the range 2-8 m/s have been measured.
Place, publisher, year, edition, pages
2005. Vol. 5, no 81, 893-900 p.
PHASE-TRANSITIONS, LASER-PULSES, SILICON, SEMICONDUCTORS, AMORPHIZATION, VELOCITIES, REGROWTH, DYNAMICS, STATES
IdentifiersURN: urn:nbn:se:uu:diva-74123OAI: oai:DiVA.org:uu-74123DiVA: diva2:102033