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MeV-atomic-ion-induced surface tracks in Langmuir-Blodgett films and L-valine crystals studied by scanning force microscopy
Uppsala University.
Uppsala University.
Uppsala University.
Uppsala University.
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1995 (English)In: INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, ISSN 0168-1176, Vol. 151, no 2-3, 147-158 p.Article in journal (Other scientific) Published
Abstract [en]

To acquire new information about the electronic sputtering of organic samples, we have obtained tapping mode scanning force microscopy images of craters induced by individual surface-grazing 48.6 MeV Br-79 ions incident on Langmuir-Blodgett (LB) and L-val

Place, publisher, year, edition, pages
ELSEVIER SCIENCE BV , 1995. Vol. 151, no 2-3, 147-158 p.
Keyword [en]
atomic force microscopy; electronic sputtering; Langmuir-Blodgett films; surface tracks; FAST HEAVY-IONS; INDUCED DESORPTION; ORGANIC-MOLECULES; SPECTROSCOPY; THERMODESORPTION; REFLECTION; EMISSION; DEFECTS
Identifiers
URN: urn:nbn:se:uu:diva-75344OAI: oai:DiVA.org:uu-75344DiVA: diva2:103254
Note
Addresses: Reimann CT, UNIV UPPSALA, DEPT RADIAT SCI, DIV ION PHYS, BOX 535, S-75121 UPPSALA, SWEDEN. UNIV UPPSALA, DEPT PHYS CHEM, S-75121 UPPSALA, SWEDEN.Available from: 2008-10-17 Created: 2008-10-17 Last updated: 2011-01-15

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