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MEV-ION-INDUCED DEFECTS IN ORGANIC-CRYSTALS
Uppsala University.
Uppsala University.
Uppsala University.
Uppsala University.
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1995 (English)In: RADIATION MEASUREMENTS, ISSN 1350-4487, Vol. 25, no 1-4, 47-50 p.Article in journal (Other scientific) Published
Abstract [en]

We present scanning force microscope images of crater-like defects induced by MeV atomic ions incident on single-crystal L-valine surfaces. For grazing incidence ions, the craters are elongated along the ion azimuth of incidence and are followed by raised

Place, publisher, year, edition, pages
PERGAMON-ELSEVIER SCIENCE LTD , 1995. Vol. 25, no 1-4, 47-50 p.
Keyword [en]
SURFACE TRACKS; ELECTRONIC SPUTTERING; SCANNING FORCE MICROSCOPY; TAPPING MODE; INDUCED DESORPTION; SURFACES; YIELDS; MODEL
Identifiers
URN: urn:nbn:se:uu:diva-76308OAI: oai:DiVA.org:uu-76308DiVA: diva2:104220
Note
Addresses: KOPNICZKY J, UNIV UPPSALA, DEPT RADIAT SCI, DIV ION PHYS, BOX 535, S-75121 UPPSALA, SWEDEN.Available from: 2008-10-17 Created: 2008-10-17 Last updated: 2011-01-15

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