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Differential scanning calorimetry analysis of the linear parabolic growth of nanometric Ni suicide thin films on a Si substrate
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2005 (English)In: Applied Physics Letters, Vol. 86, no 4, 041903-1 p.Article in journal (Refereed) Published
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2005. Vol. 86, no 4, 041903-1 p.
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URN: urn:nbn:se:uu:diva-77280OAI: oai:DiVA.org:uu-77280DiVA: diva2:105192
Available from: 2006-03-13 Created: 2006-03-13 Last updated: 2011-01-11

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Smith, Ulf

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