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Enhanced surface sensitivity in AES relative to XPS observed in free argon clusters
Uppsala University, Teknisk-naturvetenskapliga vetenskapsområdet, Physics, Department of Physics and Materials Science, Physics V.
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2005 (English)In: Surface Science, Vol. 72, no 20, 205414-15 p.Article in journal (Refereed) Published
Place, publisher, year, edition, pages
2005. Vol. 72, no 20, 205414-15 p.
URN: urn:nbn:se:uu:diva-77459OAI: oai:DiVA.org:uu-77459DiVA: diva2:105371
Available from: 2006-03-14 Created: 2006-03-14 Last updated: 2011-01-11

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Schiessling, JoachimMårtensson, Nils
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