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Depth profiling and internal structure determination of low dimensional materials using X-ray photoelectron spectroscopy
Uppsala University, Disciplinary Domain of Science and Technology, Physics, Department of Physics and Astronomy, Molecular and Condensed Matter Physics.
2016 (English)In: Hard X-ray Photoelectron Spectroscopy (HAXPES) / [ed] Joseph C. Woicik, Cham: Springer, 2016, p. 309-339Chapter in book (Refereed)
Abstract [en]

Properties of any heterostructured material depend critically on the specific composition profile of the constituent elements in the sample. X-ray photoelectron spectroscopy (XPS) is particularly well suited to probe elemental composition of any system. Tunable photon energies, available from any synchrotron centre, allow one to map out the compositional variation through a sample in a manner that can be termed non-invasive and non-destructive depth profiling. In addition, XPS is also able to provide depth resolved electronic structure information by directly mapping out occupied states at and near the Fermi energy. Recent developments at various synchrotron centers, providing access up to very high energy (~10 keV) photons with a good resolution and flux, have made it possible to estimate such compositional and electronic structure depth profiles with a greater accuracy for a wider range of materials. In this book chapter, we describe in detail the use of X-ray photoelectron spectroscopy in a selection of heterostructures, in order to illustrate the power of this technique.

Place, publisher, year, edition, pages
Cham: Springer, 2016. p. 309-339
Series
Springer Series in Surface Sciences ; 59
National Category
Physical Sciences
Identifiers
URN: urn:nbn:se:uu:diva-310301DOI: 10.1007/978-3-319-24043-5_13Scopus ID: 2-s2.0-84952361338ISBN: 9783319240435 (print)ISBN: 9783319240411 (print)OAI: oai:DiVA.org:uu-310301DiVA: diva2:1055961
Available from: 2016-12-13 Created: 2016-12-13 Last updated: 2016-12-13Bibliographically approved

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Sarma, Dipankar Das

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