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Nanocontacts fabricated by Focused Ion Beam (FIB): characterisation and application to nanometre-sized materials,
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2005 (English)In: Microscopy of Semiconducting Materials - MSMXIV (Oxford, U.K., April 11-14, 2005)., 2005Conference paper (Refereed)
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URN: urn:nbn:se:uu:diva-77752OAI: oai:DiVA.org:uu-77752DiVA: diva2:105664
Available from: 2007-04-17 Created: 2007-04-17

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Valizadeh, SimaHjort, Klas
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