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Scanning capacitance microscopy of Si implanted with single Au+ ions
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2005 (English)In: Presented at the 21st Nordic Semiconductor Meeting, Oslo, Norway, 2005Conference paper (Other (popular scientific, debate etc.))
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URN: urn:nbn:se:uu:diva-78036OAI: oai:DiVA.org:uu-78036DiVA: diva2:105949
Available from: 2007-01-25 Created: 2007-01-25

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Jensen, Jens
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Department of Engineering SciencesIon Physics

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