X-ray and Neutron Diffraction on Materials for Thin-Film Solar Cells
2016 (English)In: Advanced Characterization Techniques for Thin Film Solar Cells: Second Edition / [ed] Daniel Abou-Ras, Thomas Kirchartz, Uwe Rau, Weinheim: Wiley-VCH Verlagsgesellschaft, 2016, 2, Vol. 1-2, 421-440 p.Chapter in book (Refereed)
Among the various experimental methods, neutron and X-ray scattering have become key techniques of choice. While neutron scattering provides insights into the crystal structure with high resolution, X-ray scattering has the advantage that measurement durations are usually much shorter, compared with neutron scattering. The analysis of preferred orientations in thin films is important since it almost invariably arises as a consequence of the processes of crystallizations and recrystallizations or sintering during the growth processes of the thin films. XRD from randomly oriented polycrystalline thin films often suffers from low peak intensity and poor peak to background ratio for symmetrical XRD measurements such as Θ-2Θ powder diffraction techniques. To be able to improve the situation for weakly diffracting thin films, low-angle XRD techniques such as grazing incidence X-ray diffraction (GIXRD) have been developed. The microstructural analysis of polycrystalline thin films is performed by conducting a Le Bail analysis.
Place, publisher, year, edition, pages
Weinheim: Wiley-VCH Verlagsgesellschaft, 2016, 2. Vol. 1-2, 421-440 p.
grazing incidence X-ray diffraction, Le Bail analysis, neutron scattering, polycrystalline thin films, thin-film solar cells, X-ray scattering
Engineering and Technology Other Physics Topics
IdentifiersURN: urn:nbn:se:uu:diva-310244DOI: 10.1002/9783527699025.ch15ScopusID: 2-s2.0-84987694375ISBN: 9783527699025 (pdf)ISBN: 9783527339921 (print)OAI: oai:DiVA.org:uu-310244DiVA: diva2:1061772