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Automated line-based sequential sampling and modeling algorithm for EMC near-field scanning
Uppsala University, Disciplinary Domain of Science and Technology, Mathematics and Computer Science, Department of Information Technology, Division of Scientific Computing. Uppsala University, Disciplinary Domain of Science and Technology, Mathematics and Computer Science, Department of Information Technology, Computational Science.ORCID iD: 0000-0002-3123-3478
2017 (English)In: IEEE transactions on electromagnetic compatibility (Print), ISSN 0018-9375, E-ISSN 1558-187X, Vol. 59, p. 704-709Article in journal (Refereed) Published
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2017. Vol. 59, p. 704-709
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Computer Sciences Signal Processing
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URN: urn:nbn:se:uu:diva-318915DOI: 10.1109/TEMC.2016.2632741ISI: 000395445000020OAI: oai:DiVA.org:uu-318915DiVA, id: diva2:1087052
Available from: 2016-12-07 Created: 2017-04-05 Last updated: 2018-01-13Bibliographically approved

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Singh, Prashant

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