Near-edge X-ray refraction fine structure microscopy
2017 (English)In: Applied Physics Letters, ISSN 0003-6951, E-ISSN 1077-3118, Vol. 110, no 6, 063101Article in journal (Refereed) Published
We demonstrate a method for obtaining increased spatial resolution and specificity in nanoscale chemical composition maps through the use of full refractive reference spectra in soft x-ray spectro- microscopy. Using soft x-ray ptychography, we measure both the absorption and refraction of x-rays through pristine reference materials as a function of photon energy and use these reference spectra as the basis for decomposing spatially resolved spectra from a heterogeneous sample, thereby quantifying the composition at high resolution. While conventional instruments are limited to absorption contrast, our novel refraction based method takes advantage of the strongly energy dependent scattering cross-section and can see nearly five-fold improved spatial resolution on resonance.
Place, publisher, year, edition, pages
AMER INST PHYSICS , 2017. Vol. 110, no 6, 063101
Other Physics Topics Atom and Molecular Physics and Optics
IdentifiersURN: urn:nbn:se:uu:diva-319569DOI: 10.1063/1.4975377ISI: 000394058600031OAI: oai:DiVA.org:uu-319569DiVA: diva2:1087170