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Electronic structure investigation of biphenylene films
Univ Aquila, Dept Phys & Chem Sci, Via Vetoio, I-67100 Coppito, Italy.;Univ Pierre & Marie Curie Paris VI, UMR CNRS 7197, Lab Reactivite Surface, Tour 43-44 3eme etage,Case 178,4 Pl Jussieu, F-75005 Paris, France..
Univ Trieste, Dept Chem & Pharmaceut Sci, I-34127 Trieste, Italy.;CNR, ISM, SS 14 km 163-5, I-34149 Trieste, Basovizza, Italy..
Uppsala University, Disciplinary Domain of Science and Technology, Physics, Department of Physics and Astronomy, Molecular and Condensed Matter Physics.
Helmholtz Zentrum Berlin, Inst Methods & Instrumentat Synchrotron Rad Res, Albert Einstein St 15, D-12489 Berlin, Germany..
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2017 (English)In: Journal of Chemical Physics, ISSN 0021-9606, E-ISSN 1089-7690, Vol. 146, no 5, article id 054705Article in journal (Refereed) Published
Abstract [en]

Photoelectron Spectroscopy (PS) and Near-Edge X-ray Absorption Fine Structure (NEXAFS) spectroscopy have been used to investigate the occupied and empty density of states of biphenylene films of different thicknesses, deposited onto a Cu(111) crystal. The obtained results have been compared to previous gas phase spectra and single molecule Density Functional Theory (DFT) calculations to get insights into the possible modification of the molecular electronic structure in the film induced by the adsorption on a surface. Furthermore, NEXAFS measurements allowed characterizing the variation of the molecular arrangement with the film thickness and helped to clarify the substrate-molecule interaction. Published by AIP Publishing.

Place, publisher, year, edition, pages
American Institute of Physics (AIP), 2017. Vol. 146, no 5, article id 054705
National Category
Chemical Sciences Physical Sciences
Identifiers
URN: urn:nbn:se:uu:diva-320469DOI: 10.1063/1.4975104ISI: 000394576600053PubMedID: 28178795OAI: oai:DiVA.org:uu-320469DiVA, id: diva2:1091334
Available from: 2017-04-26 Created: 2017-04-26 Last updated: 2017-04-26Bibliographically approved

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Zhang, T.Lüder, J.Brena, B.Puglia, C.

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