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MeV ion irradiation effects on the luminescence properties of Si-implanted SiO2-thin films
Uppsala University, Disciplinary Domain of Science and Technology, Physics, Department of Physics and Astronomy, Applied Nuclear Physics.
Royal Inst Technol KTH, Sch Informat & Commun Technol, POB Electrum 229, S-16440 Kista, Sweden..
Royal Inst Technol KTH, Sch Informat & Commun Technol, POB Electrum 229, S-16440 Kista, Sweden..
Royal Inst Technol KTH, Sch Informat & Commun Technol, POB Electrum 229, S-16440 Kista, Sweden..
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2016 (English)In: Physica Status Solidi. C, Current topics in solid state physics, ISSN 1610-1634, E-ISSN 1610-1642, Vol. 13, no 10-12, 921-926 p.Article in journal (Refereed) Published
Abstract [en]

The effects of MeV heavy ion irradiation at varying fluence and flux on excess Si, introduced in SiO2 by keV ion implantation, are investigated by photoluminescence (PL). From the PL peak wavelength (lambda) and decay lifetime (t), two PL sources are distinguished: i) quasi-direct recombination of excitons of Si-nanoparticles (SiNPs), appearing after thermal annealing (lambda > 720 nm, tau similar to mu s), and ii) fast-decay PL, possibly due to oxide-related defects (lambda similar to 575-690 nm, tau similar to ns). The fast-decay PL (ii) observed before and after ion irradiation is induced by ion implantation. It is found that this fast-decay luminescence decreases for higher irradiation fluence of MeV heavy ions. After thermal annealing (forming SiNPs), the SiNP PL is reduced for samples irradiated by MeV heavy ions but found to stabilize at higher level for higher irradiation flux; the (ii) band vanishes as a result of annealing. The results are discussed in terms of the influence of electronic and nuclear stopping powers.

Place, publisher, year, edition, pages
WILEY-V C H VERLAG GMBH , 2016. Vol. 13, no 10-12, 921-926 p.
Keyword [en]
silicon nanoparticle, ion implantation, photoluminescence, MeV heavy ion irradiation
National Category
Physical Sciences
Identifiers
URN: urn:nbn:se:uu:diva-322309DOI: 10.1002/pssc.201600077ISI: 000399448900040OAI: oai:DiVA.org:uu-322309DiVA: diva2:1096753
Conference
EMRS Spring Meeting / Symposium K / Symposium BB / Symposium E / Symposium O / Symposium Y, MAY 02-06, 2016, Lille, FRANCE
Funder
Swedish Research Council
Available from: 2017-05-19 Created: 2017-05-19 Last updated: 2017-05-19Bibliographically approved

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Chulapakorn, ThawatchartPrimetzhofer, Daniel

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