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Resonant soft X-ray Raman scattering of NiO
Uppsala University, Disciplinary Domain of Science and Technology, Physics, Department of Physics, Physics II.
Uppsala University, Disciplinary Domain of Science and Technology, Physics, Department of Physics, Physics II.
Uppsala University, Disciplinary Domain of Science and Technology, Physics, Department of Physics, Physics II.
Uppsala University, Disciplinary Domain of Science and Technology, Physics, Department of Physics, Physics II.
2002 (English)In: Journal of Physics: Condensed Matter, ISSN 0953-8984, E-ISSN 1361-648X, Vol. 14, no 13, 3669-3676 p.Article in journal (Refereed) Published
Abstract [en]

Resonant soft x-ray Raman scattering measurements on NiO have been made at photon energies across the Ni 2p absorption edges. The details of the spectral features are identified as Raman scattering due to d-d and charge-transfer excitations. The spectra are interpreted within the single-impurity Anderson model, including multiplets, crystal-field and charge-transfer effects. At threshold excitation, the spectral features consists of triplet-triplet and triplet-singlet transitions of the 3d8 configuration. For excitation energies corresponding to the charge-transfer region in the Ni 2p x-ray absorption spectrum of NiO, the emission spectra are instead dominated by charge-transfer transitions to the 3d9\underline L-1 final state. Comparisons of the final states with other spectroscopical techniques are also made.

Place, publisher, year, edition, pages
2002. Vol. 14, no 13, 3669-3676 p.
National Category
Physical Sciences
Identifiers
URN: urn:nbn:se:uu:diva-83935DOI: 10.1088/0953-8984/14/13/324OAI: oai:DiVA.org:uu-83935DiVA: diva2:111843
Available from: 2007-02-09 Created: 2007-02-09 Last updated: 2017-12-14Bibliographically approved

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Magnuson, MartinButorin, SergeiNordgren, Joseph

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