uu.seUppsala University Publications
Change search
CiteExportLink to record
Permanent link

Direct link
Cite
Citation style
  • apa
  • ieee
  • modern-language-association
  • vancouver
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf
Preparation and characterization of electrochemically etched W tips for STM
Uppsala University.
Uppsala University.
Uppsala University.
Uppsala University.
Show others and affiliations
1999 (English)In: MEASUREMENT SCIENCE & TECHNOLOGY, ISSN 0957-0233, Vol. 10, no 1, 11-18 p.Article in journal (Other scientific) Published
Abstract [en]

We have investigated methods for cleaning de-etched polycrystalline tungsten tips for scanning tunnelling microscopy (STM). The cleaning methods include Ar-ion sputtering, heating, chemical treatments and Ne-ion self-sputtering. We correlate transmission

Place, publisher, year, edition, pages
IOP PUBLISHING LTD , 1999. Vol. 10, no 1, 11-18 p.
Keyword [en]
STM tip shape; STM tip composition; UHV; TEM; STM; scanning tunnelling microscopy; SCANNING-TUNNELING-MICROSCOPY; TUNGSTEN TIPS
Identifiers
URN: urn:nbn:se:uu:diva-84659OAI: oai:DiVA.org:uu-84659DiVA: diva2:112567
Note
Addresses: Ekvall I, Chalmers Univ Technol, SE-41296 Gothenburg, Sweden. Chalmers Univ Technol, SE-41296 Gothenburg, Sweden. Uppsala Univ, Angstrom Lab, SE-75121 Uppsala, Sweden.Available from: 2008-10-17 Created: 2008-10-17 Last updated: 2011-01-14

Open Access in DiVA

No full text

By organisation
Uppsala University

Search outside of DiVA

GoogleGoogle Scholar

urn-nbn

Altmetric score

urn-nbn
Total: 466 hits
CiteExportLink to record
Permanent link

Direct link
Cite
Citation style
  • apa
  • ieee
  • modern-language-association
  • vancouver
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf