Optical constants of sputter-deposited Ti-Ce oxide and Zr-Ce oxide films
1998 (English)In: APPLIED OPTICS, ISSN 0003-6935, Vol. 37, no 25, 5993-6001 p.Article in journal (Refereed) Published
Films of Ti oxide, Zr oxide, Ce oxide, Ti-Ce oxide, and
Zr-Ce oxide were made by means of reactive de
magnetron sputtering in a multitarget arrangement.
The films were characterized by x-ray diffraction and
electrochemical measurements, both technique
Place, publisher, year, edition, pages
OPTICAL SOC AMER , 1998. Vol. 37, no 25, 5993-6001 p.
ION-ASSISTED DEPOSITION; ELECTROCHROMIC TUNGSTEN-OXIDE; ZIRCONIA THIN-FILMS; CERIUM DIOXIDE; ELECTROCHEMICAL PROPERTIES; SUBSTRATE-TEMPERATURE; ABSORPTION; COATINGS; INTERCALATION; EVAPORATION
IdentifiersURN: urn:nbn:se:uu:diva-84679OAI: oai:DiVA.org:uu-84679DiVA: diva2:112587
Addresses: Veszelei M, Univ Uppsala, Angstrom Lab, Dept Mat Sci, POB 534, S-75121 Uppsala, Sweden. Univ Uppsala, Angstrom Lab, Dept Mat Sci, S-75121 Uppsala, Sweden. Univ Calif Berkeley, Lawrence Berkeley Lab, Berkeley, CA 94720 USA.2008-10-172008-10-172011-01-14