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Electron tomography analysis of 3D interfacial nanostructures appearing in annealed Si rich SiC films
Uppsala University, Disciplinary Domain of Science and Technology, Technology, Department of Engineering Sciences, Applied Materials Sciences.
Photovoltaic Materials and Devices, Delft University of Technology.
Uppsala University, Disciplinary Domain of Science and Technology, Physics, Department of Physics and Astronomy.
Uppsala University, Disciplinary Domain of Science and Technology, Physics, Department of Physics and Astronomy.
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2017 (English)In: Nanoscale, ISSN 2040-3364, E-ISSN 2040-3372Article in journal (Refereed) Published
Place, publisher, year, edition, pages
2017.
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Engineering and Technology Physical Sciences
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URN: urn:nbn:se:uu:diva-330777OAI: oai:DiVA.org:uu-330777DiVA: diva2:1146693
Available from: 2017-10-03 Created: 2017-10-03 Last updated: 2017-10-03

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