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Spectroscopic electron tomography analysis of 3D interfacial nanostructures appearing in annealed Si rich SiC films
Uppsala University, Disciplinary Domain of Science and Technology, Technology, Department of Engineering Sciences, Applied Materials Sciences.
(Photovoltaic Materials and Devices, Delft Univeristy of Technology, P.O. Box 5031, 2600 GA Delft, The Netherlands)
Uppsala University, Disciplinary Domain of Science and Technology, Physics, Department of Physics and Astronomy.
Uppsala University, Disciplinary Domain of Science and Technology, Physics, Department of Physics and Astronomy.
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2017 (English)Conference paper, Oral presentation only (Refereed)
Place, publisher, year, edition, pages
2017.
National Category
Physical Sciences Engineering and Technology
Identifiers
URN: urn:nbn:se:uu:diva-330784OAI: oai:DiVA.org:uu-330784DiVA: diva2:1146702
Conference
Microscopy conference
Available from: 2017-10-03 Created: 2017-10-03 Last updated: 2017-10-03

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CiteExportLink to record
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  • apa
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