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Secondary ion mass spectrometry as a tool to study selenium gradient in Cu2ZnSn(S,Se)4
Univ Oslo, Dept Phys, Ctr Mat Sci & Nanotechnol, POB 1048, N-0316 Oslo, Norway..
Univ Oslo, Dept Phys, Ctr Mat Sci & Nanotechnol, POB 1048, N-0316 Oslo, Norway..
Univ Oslo, Dept Phys, Ctr Mat Sci & Nanotechnol, POB 1048, N-0316 Oslo, Norway..
Univ Oslo, Dept Phys, Ctr Mat Sci & Nanotechnol, POB 1048, N-0316 Oslo, Norway..
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2017 (English)In: Physica Status Solidi. C, Current topics in solid state physics, ISSN 1610-1634, E-ISSN 1610-1642, no 6, UNSP 1600187Article in journal, Meeting abstract (Refereed) Published
Abstract [en]

Secondary ion mass spectrometry (SIMS) has been utilized to study compositional gradients in compound-sputtered and annealed Cu2ZnSn(S,Se)(4) (CZTSSe). SIMS image depth profiling shows a non-uniform spatial distribution of selenium and supports a mechanism where selenization is accompanied by grain growth rather than substitution of selenium for sulfur. Furthermore, SIMS depth profiles of S and Se using O-2(+) primary ions and detecting molecular ions of the MCs+ type using Cs+ primary ions have been compared, where a linear relationship between the sulfur and selenium concentration suitable for compositional analysis is observed for concentrations with an Se/(S+Se) ratio in the range from 0.25 to 0.65. 3D image of the spatial Se distribution in a 20 x 20 mu m(2) grid measured with SIMS image depth profiling.

Place, publisher, year, edition, pages
2017. no 6, UNSP 1600187
Keyword [en]
Cu2ZnSn(S, Se)(4), kesterite, secondary ion mass spectrometry, Se gradient
National Category
Electrical Engineering, Electronic Engineering, Information Engineering Materials Engineering
Identifiers
URN: urn:nbn:se:uu:diva-333345DOI: 10.1002/pssc.201600187ISI: 000405267800028OAI: oai:DiVA.org:uu-333345DiVA: diva2:1156598
Conference
20th International Conference on Ternary and Multinary Compounds (ICTMC), SEP 05-09, 2016, Halle, GERMANY
Note

Title in WoS: Secondary ion mass spectrometry as a tool to study selenium gradient in Cu2ZnSn(S,Se)(4)

Available from: 2017-11-13 Created: 2017-11-13 Last updated: 2017-11-13Bibliographically approved

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Publisher's full texthttp://onlinelibrary.wiley.com/doi/10.1002/pssc.201600187/abstract

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Platzer Björkman, Charlotte

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