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Surface oxide and roughness on test samples for the Ultra High Vacuum section of the Laser Heater for the European XFEL
KTH Royal Inst Technol, Dept Fus Plasma Phys, Sch Elect Engn, SE-10044 Stockholm, Sweden..
KTH Royal Inst Technol, Dept Fus Plasma Phys, Sch Elect Engn, SE-10044 Stockholm, Sweden..
Uppsala University, Disciplinary Domain of Science and Technology, Physics, Department of Physics and Astronomy, FREIA.
2018 (English)In: Vacuum, ISSN 0042-207X, E-ISSN 1879-2715, Vol. 149, p. 83-86Article in journal (Refereed) Published
Abstract [en]

The European X-ray Free Electron Laser has recently started with operation for users. An approximately 3 m long ultra high vacuum laser heater section is implemented to overcome possible electron bunch instabilities. We describe the process of determining the oxide layer thickness and surface roughness on test samples of the internal surface material in the laser heater vacuum chambers using elastic recoil detection analysis and optical surface profiling. The results are compared to specified values and show that surface roughness on the samples is larger than the requested maximum, with RMS deviations from a mean plane of up to 1.76 mu m for 0.60 x 0.45 square millimeter scans. The maximum oxide layer thickness is 5.5 nm on non-electropolished surfaces assuming cuprous oxide with density 6.0 g per cubic centimeter and 4.0 nm on electropolished surfaces.

Place, publisher, year, edition, pages
PERGAMON-ELSEVIER SCIENCE LTD , 2018. Vol. 149, p. 83-86
Keywords [en]
European XFEL, Laser Heater, Vacuum chambers, Surface roughness, Oxide
National Category
Accelerator Physics and Instrumentation
Identifiers
URN: urn:nbn:se:uu:diva-348837DOI: 10.1016/j.vacuum.2017.12.014ISI: 000425576100014OAI: oai:DiVA.org:uu-348837DiVA, id: diva2:1200046
Funder
Swedish Foundation for Strategic Research , RIF14-0053Swedish Research Council, 821-2012-5144, 828-2008-1093Stiftelsen Olle Engkvist Byggmästare, 2013/689Available from: 2018-04-23 Created: 2018-04-23 Last updated: 2018-04-23Bibliographically approved

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Hamberg, Mathias

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