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Elemental Distribution in CrNbTaTiW-C High Entropy Alloy Thin Films
Chalmers Univ Technol, Dept Phys, SE-41296 Gothenburg, Sweden.
Uppsala University, Disciplinary Domain of Science and Technology, Chemistry, Department of Chemistry - Ångström, Inorganic Chemistry.
Chalmers Univ Technol, Dept Phys, SE-41296 Gothenburg, Sweden.ORCID iD: 0000-0002-6097-6895
Uppsala University, Disciplinary Domain of Science and Technology, Chemistry, Department of Chemistry - Ångström, Inorganic Chemistry.
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2019 (English)In: Microscopy and Microanalysis, ISSN 1431-9276, E-ISSN 1435-8115, Vol. 25, no 2, p. 489-500Article in journal (Refereed) Published
Abstract [en]

The microstructure and distribution of the elements have been studied in thin films of a near-equimolar CrNbTaTiW high entropy alloy (HEA) and films with 8 at.% carbon added to the alloy. The films were deposited by magnetron sputtering at 300 degrees C. X-ray diffraction shows that the near-equimolar metallic film crystallizes in a single-phase body centered cubic (bcc) structure with a strong (110) texture. However, more detailed analyses with transmission electron microscopy (TEM) and atom probe tomography (APT) show a strong segregation of Ti to the grain boundaries forming a very thin Ti-Cr rich interfacial layer. The effect can be explained by the large negative formation enthalpy of Ti-Cr compounds and shows that CrNbTaTiW is not a true HEA at lower temperatures. The addition of 8 at.% carbon leads to the formation of an amorphous structure, which can be explained by the limited solubility of carbon in bcc alloys. TEM energy-dispersive X-ray spectroscopy indicated that all metallic elements are randomly distributed in the film. The APT investigation, however, revealed that carbide-like clusters are present in the amorphous film.

Place, publisher, year, edition, pages
CAMBRIDGE UNIV PRESS , 2019. Vol. 25, no 2, p. 489-500
Keywords [en]
atom probe tomography, carbon clustering, high entropy alloy, segregation, thin film
National Category
Materials Chemistry
Identifiers
URN: urn:nbn:se:uu:diva-385570DOI: 10.1017/S1431927618016264ISI: 000466756600025PubMedID: 30712522OAI: oai:DiVA.org:uu-385570DiVA, id: diva2:1327060
Conference
Atom Probe Tomography and Microscopy (APT and M) Conference, JUN 10-15, 2018, Gaithersburg, MD
Funder
Swedish Research Council, 621-2012-4359Swedish Research Council, 622-2008-405Knut and Alice Wallenberg FoundationSwedish Foundation for Strategic Research , RMA11-0029Available from: 2019-06-19 Created: 2019-06-19 Last updated: 2019-06-19Bibliographically approved

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Fritze, StefanMalinovskis, PauliusRiekehr, LarsJansson, Ulf

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