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In-situ composition analysis of photochromic yttrium oxy-hydride thin films under light illumination
Uppsala University, Disciplinary Domain of Science and Technology, Physics, Department of Physics and Astronomy, Applied Nuclear Physics.ORCID iD: 0000-0003-4334-7461
Uppsala University, Disciplinary Domain of Science and Technology, Physics, Department of Physics and Astronomy, Materials Physics. Department of Material Science, Moscow Engineering Physics Institute; Department of Solar Energy, Institute for Energy Technology.
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2019 (English)In: Solar Energy Materials and Solar Cells, ISSN 0927-0248, E-ISSN 1879-3398, Vol. 201, article id 110119Article in journal (Refereed) Published
Abstract [en]

In this work, we investigate the chemical composition of a reactively sputtered photochromic YHxOy thin film by non-destructive ion beam-based techniques, i.e., Rutherford Backscattering Spectrometry, Particle-Induced X-Ray Emission, Time-of-Flight/Energy coincidence Elastic Recoil Detection Analysis and Elastic Backscattering Spectrometry. To enhance the accuracy of the analysis, the set of spectra was evaluated in an iterative self-consistent approach. This procedure resulted in high-resolution depth profiles of the chemical composition and revealed a thin oxygen-rich-layer on the surface, which apparently does not act as a self-passivation layer. In the film, the concentration of Y remains practically constant, whereas O replaces H during the oxidation process. In-situ light illumination was performed during the compositional analysis in a high vacuum setup. The results from these measurements demonstrate that, for these samples, the induced reversible photochromism is not linked to any detectable change in the bulk composition of the film and can thus take place even in a vacuum environment.

Place, publisher, year, edition, pages
2019. Vol. 201, article id 110119
Keywords [en]
Yttrium oxy-hydride, Photochromic effect, In-situ ion beam analysis, Chemical composition
National Category
Atom and Molecular Physics and Optics
Identifiers
URN: urn:nbn:se:uu:diva-390957DOI: 10.1016/j.solmat.2019.110119ISI: 000487572500044OAI: oai:DiVA.org:uu-390957DiVA, id: diva2:1343397
Funder
Carl Tryggers foundation Swedish InstituteSwedish Research Council, 821-2012-5144Swedish Research Council, 2017-00646_9Swedish Foundation for Strategic Research , RIF14-0053The Research Council of NorwayAvailable from: 2019-08-16 Created: 2019-08-16 Last updated: 2019-10-31Bibliographically approved

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Moro, Marcos V.Moldarev, DmitriiWolff, MaxPrimetzhofer, Daniel

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