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Preparation and characterization of 33S samples for 33S(n,alpha)30Si cross-section measurements at the n_TOF facility at CERN
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2018 (English)In: Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, ISSN 0168-9002, E-ISSN 1872-9576, Vol. 890, p. 142-147Article in journal (Refereed) Published
Abstract [en]

Thin 33S samples for the study of the 33S(n,alpha)30Si cross-section at the n_TOF facility at CERN were made by thermal evaporation of 33S powder onto a dedicated substrate made of kapton covered with thin layers of copper, chromium and titanium. This method has provided for the first time bare sulfur samples a few centimeters in diameter. The samples have shown an excellent adherence with no mass loss after few years and no sublimation in vacuum at room temperature. The determination of the mass thickness of 33S has been performed by means of Rutherford backscattering spectrometry. The samples have been successfully tested under neutron irradiation.

Place, publisher, year, edition, pages
2018. Vol. 890, p. 142-147
Keywords [en]
Neutron induced alpha emission, Thermal evaporation, Rutherford backscattering
National Category
Subatomic Physics
Identifiers
URN: urn:nbn:se:uu:diva-394873DOI: 10.1016/j.nima.2018.02.055OAI: oai:DiVA.org:uu-394873DiVA, id: diva2:1359618
Available from: 2019-10-09 Created: 2019-10-09 Last updated: 2019-10-09

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Publisher's full texthttp://www.sciencedirect.com/science/article/pii/S0168900218302110

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Tarrio, Diego

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Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
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