Micromachined thermally compensated thin film Lamb wave resonator for frequency control and sensing applications
2009 (English)In: Journal of Micromechanics and Microengineering, ISSN 0960-1317, E-ISSN 1361-6439, Vol. 19, no 3, 035018- p.Article in journal (Refereed) Published
Micromachined thin film plate acoustic wave resonators (FPAR) utilizing the lowest order symmetric Lamb wave (S0) propagating in highly textured 2μm thick Aluminum Nitride (AlN) membranes have been successfully demonstrated . The proposed devices have a SAW-based design and exhibit Q factors of up to 3000 at a frequency around 900MHz as well as design flexibility with respect to the required motional resistance. However, a notable drawback of the proposed devices is non-zero temperature coefficient of frequency (TCF) which lies in the range -20 ppm/K to –25 ppm/K. Thus, despite the promising features demonstrated, further device optimization is required. In this work temperature compensation of thin AlN film Lamb wave resonators is studied and experimentally demonstrated. Temperature compensation while retaining at the same time the device electromechanical coupling is experimentally demonstrated. The zero TCF Lamb wave resonators are fabricated onto composite AlN/SiO2 membranes. Q factors of around 1400 have been measured at a frequency of around 755 MHz. Finally, the impact of technological issues on the device performance is discussed in view of improving the device performance.
Place, publisher, year, edition, pages
2009. Vol. 19, no 3, 035018- p.
Other Electrical Engineering, Electronic Engineering, Information Engineering
Research subject Electronics
IdentifiersURN: urn:nbn:se:uu:diva-89404DOI: 10.1088/0960-1317/19/3/035018ISI: 000263678200019OAI: oai:DiVA.org:uu-89404DiVA: diva2:160293
FunderSwedish Research Council, 2009-5056