ERDA of Ni-Al2O3/SiO2 solar thermal selective absorbers
2008 (English)In: Solar Energy Materials and Solar Cells, ISSN 0927-0248, E-ISSN 1879-3398, Vol. 92, no 10, 1177-1182 p.Article in journal (Refereed) Published
Thin film materials for the use in solar thermal absorbers have been investigated using time-of-flight energy elastic recoil detection analysis (ERDA). The ERDA measurements proved to be very efficient in detecting the elemental depth composition of a selective solar absorber. The three-layer absorber is composed of an 80% nickel-20% alumina film at the base, a 40% nickel-60% alumina layer in the middle and finally an AR film of silica or hybrid-silica film at the top. The difference between solution volume percent and actual volume percent could be investigated when studying individual nickel-alumina films with varying ratios coated on glass substrates. The result showed that there was a maximum difference of 3% between the calculated solution volume percent and the actual volume percentages in the solid films. The ERDA measurements also indicate that about 15% of the nickel found in the nickel-alumina composite films is bound in the form of NiO.
Place, publisher, year, edition, pages
2008. Vol. 92, no 10, 1177-1182 p.
solar, absorber, selective, SEM, ToF-ERDA
Engineering and Technology Subatomic Physics
Research subject Ion Physics
IdentifiersURN: urn:nbn:se:uu:diva-94902DOI: 10.1016/j.solmat.2008.02.014ISI: 000258431300001OAI: oai:DiVA.org:uu-94902DiVA: diva2:168919