Study of the electrical parameters drift due to mechanical stress in coupled conductors path on flexible polymeric substrateShow others and affiliations
2022 (English)In: 2022 Argentine Conference on Electronics (CAE) / [ed] Julian, P; Andreou, AG, Institute of Electrical and Electronics Engineers (IEEE), 2022, p. 37-40Conference paper, Published paper (Refereed)
Abstract [en]
In this work, the behavior of the drift in electrical impedance values of a coupled device constituting a flat rectangular inductor surrounded by a coupled antenna while subjected to mechanical stresses of over 10,000 bending-stretching cycles has been studied. It has shown correlation with mechanical aging and also is influenced by temperature variations on the device surface. The impact of the mechanical stress was studied separately for the bending-stretching and relaxation phases, considering in both cases the effect of temperature changes and mechanical stress, in order to obtain an adjustment equation for the measured experimental data.. From the fit, it was observed that when using an exponential function for the drift effect due to mechanical stress, the experimental curve was fitted with R-2=0.91 for the bending-stretching phase and R-2=0.79 for the relaxation phase.
Place, publisher, year, edition, pages
Institute of Electrical and Electronics Engineers (IEEE), 2022. p. 37-40
Keywords [en]
Flexible electronics, electrical impedance drift, bending-stretching mechanical stress, degradation, exponential fitting
National Category
Condensed Matter Physics
Identifiers
URN: urn:nbn:se:uu:diva-485325DOI: 10.1109/CAE54497.2022.9762502ISI: 000851475100008ISBN: 978-1-7281-7335-1 (electronic)ISBN: 978-1-7281-9265-9 (print)OAI: oai:DiVA.org:uu-485325DiVA, id: diva2:1699467
Conference
4th Argentine Conference on Electronics (CAE), MAR 10-11, 2022, La Rioja, ARGENTINA
2022-09-282022-09-282022-12-19Bibliographically approved