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Stability limits of superlattice growth: the case of Cr/V (001)
Uppsala University, Disciplinary Domain of Science and Technology, Physics, Department of Physics and Materials Science.
Uppsala University, Disciplinary Domain of Science and Technology, Physics, Department of Physics and Materials Science.
Uppsala University, Disciplinary Domain of Science and Technology, Physics, Department of Physics and Materials Science.
2008 (English)In: Thin Solid Films, ISSN 0040-6090, E-ISSN 1879-2731, Vol. 516, no 23, 8468-8472 p.Article in journal (Refereed) Published
Abstract [en]

The crystalline quality of bct Cr/V (001) superlattices is found to be strongly dependent on the thickness ratio of the constituents. The out-of-plane coherence length varies from 275 Å to 880 Å, corresponding to 30% and close to 100% of the total film thicknesses, which was kept the same for all the samples. The width of the rocking curve (mosaicity) varies as much as from below 0.02° to 0.8°. Using an adaptation of the Matthews–Blakeslee theory for critical thickness, we define a parameter window available for the growth of superior Cr/V (001) superlattices.

Place, publisher, year, edition, pages
2008. Vol. 516, no 23, 8468-8472 p.
Keyword [en]
Superlattices, Multilayers, Epitaxial growth, Magnetron sputtering
National Category
Physical Sciences
Identifiers
URN: urn:nbn:se:uu:diva-101233DOI: 10.1016/j.tsf.2008.04.097ISI: 000260579800040OAI: oai:DiVA.org:uu-101233DiVA: diva2:212125
Available from: 2009-04-21 Created: 2009-04-21 Last updated: 2017-12-13Bibliographically approved

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Hjörvarsson, Björgvin

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