Stability limits of superlattice growth: the case of Cr/V (001)
2008 (English)In: Thin Solid Films, ISSN 0040-6090, E-ISSN 1879-2731, Vol. 516, no 23, 8468-8472 p.Article in journal (Refereed) Published
The crystalline quality of bct Cr/V (001) superlattices is found to be strongly dependent on the thickness ratio of the constituents. The out-of-plane coherence length varies from 275 Å to 880 Å, corresponding to 30% and close to 100% of the total film thicknesses, which was kept the same for all the samples. The width of the rocking curve (mosaicity) varies as much as from below 0.02° to 0.8°. Using an adaptation of the Matthews–Blakeslee theory for critical thickness, we define a parameter window available for the growth of superior Cr/V (001) superlattices.
Place, publisher, year, edition, pages
2008. Vol. 516, no 23, 8468-8472 p.
Superlattices, Multilayers, Epitaxial growth, Magnetron sputtering
IdentifiersURN: urn:nbn:se:uu:diva-101233DOI: 10.1016/j.tsf.2008.04.097ISI: 000260579800040OAI: oai:DiVA.org:uu-101233DiVA: diva2:212125