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Numerical Parameterization of Chemical-Vapor-Deposited (CVD) Single-Crystal Diamond for Device Simulation and Analysis
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2008 (English)In: IEEE Transactions on Electron Devices, ISSN 0018-9383, E-ISSN 1557-9646, Vol. 55, no 10, 2744-2756 p.Article in journal (Refereed) Published
Abstract [en]

High-quality electronic-grade intrinsic chemical-vapor-deposited (CVD) single-crystal diamond layers having exceptionally high carrier mobilities have been reported by Isberg et al. This makes the realization of novel electronic devices in diamond, particularly for high-voltage and high-temperature applications, a viable proposition. As such, material models which can capture the particular features of diamond as a semiconductor are required to analyze, optimize, and quantitatively design new devices. For example, the incomplete ionization of boron in diamond and the transition to metallic conduction in heavily boron-doped layers require accurate carrier freeze-out models to be included in the simulation of diamond devices. Models describing these phenomena are proposed in this paper and include numerical approximation of intrinsic diamond which is necessary to formulate doping- and temperature-dependent mobility models. They enable a concise numerical description of single-crystal diamond which agrees with data obtained from material characterization. The models are verified by application to new Schottky m-i-p(+) diode structures in diamond. Simulated forward characteristics show excellent correlation with experimental measurements. In spite of the lack of impact ionization data for single-crystal diamond, approximation of avalanche coefficient parameters from other wide-bandgap semiconductors has also enabled the reverse blocking characteristics of diamond diodes to be simulated. Acceptable agreement with breakdown voltage from experimental devices made with presently available single-crystal CVD diamond is obtained.

Place, publisher, year, edition, pages
2008. Vol. 55, no 10, 2744-2756 p.
Keyword [en]
Diamond, numerical parameterisation, Schottky diodes, semiconductor device modeling
National Category
Electrical Engineering, Electronic Engineering, Information Engineering
URN: urn:nbn:se:uu:diva-107126DOI: 10.1109/TED.2008.2003225ISI: 000260252700026OAI: oai:DiVA.org:uu-107126DiVA: diva2:227723
Available from: 2009-07-16 Created: 2009-07-16 Last updated: 2016-04-13Bibliographically approved

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