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X-ray diffuse scattering measurements of nucleation dynamics at femtosecond resolution.
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2008 (English)In: Physical Review Letters, ISSN 0031-9007, Vol. 100, no 13, 135502-1-135502-5 p.Article in journal (Refereed) Published
Abstract [en]

Femtosecond time-resolved small and wide angle x-ray diffuse scattering techniques are applied to investigate the ultrafast nucleation processes that occur during the ablation process in semiconducting materials. Following intense optical excitation, a transient liquid state of high compressibility characterized by large-amplitude density fluctuations is observed and the buildup of these fluctuations is measured in real time. Small-angle scattering measurements reveal snapshots of the spontaneous nucleation of nanoscale voids within a metastable liquid and support theoretical predictions of the ablation process.

Place, publisher, year, edition, pages
2008. Vol. 100, no 13, 135502-1-135502-5 p.
National Category
Physical Sciences
URN: urn:nbn:se:uu:diva-110435DOI: 10.1103/PhysRevLett.100.135502ISI: 000254670300046PubMedID: 18517965OAI: oai:DiVA.org:uu-110435DiVA: diva2:277210
Available from: 2009-11-16 Created: 2009-11-16 Last updated: 2009-11-18Bibliographically approved

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