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Photofragmentation of SiF4 upon Si 2p and F 1s core excitation: Cation and anion yield spectroscopy
Uppsala University, Disciplinary Domain of Science and Technology, Physics, Department of Physics.
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2008 (English)In: Journal of Chemical Physics, ISSN 0021-9606, E-ISSN 1089-7690, Vol. 128, no 13, 134309- p.Article in journal (Refereed) Published
Abstract [en]

We have studied the fragmentation dynamics of core-excited SiF4 by means of soft-x-ray photoexcitation and partial positive and negative ion yield measurements around the Si L-2,L-3-shell and F K-shell ionization thresholds. All detectable ionic fragments are reported and we observe significant differences between the various partial ion yields near the Si 2p threshold. The differences are similar to our previous results from CH3Cl showing more extended fragmentation in correspondence to transitions to Rydberg states. At variance with smaller systems, we observe negative ion production in the shape resonance region. This can be related to the possibility in a relatively large system to dissipate positive charge over several channels.

Place, publisher, year, edition, pages
2008. Vol. 128, no 13, 134309- p.
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Physical Sciences
Identifiers
URN: urn:nbn:se:uu:diva-110439DOI: 10.1063/1.2851135ISI: 000254778800020OAI: oai:DiVA.org:uu-110439DiVA: diva2:277225
Available from: 2009-11-16 Created: 2009-11-16 Last updated: 2017-12-12

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