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Low-frequency current noise in electrochromic devices
Uppsala University, Disciplinary Domain of Science and Technology, Technology, Department of Engineering Sciences, Solid State Physics.
2008 (English)In: Smart materials and structures (Print), ISSN 0964-1726, E-ISSN 1361-665X, Vol. 17, no 2, 025005- p.Article in journal (Refereed) Published
Abstract [en]

1/f noise was observed in electrochromic (EC) devices capable of modulating their optical transmittance by an applied voltage. The device comprised nanoporous W oxide and Ni- V oxide films and an intervening polymer electrolyte between transparent conducting In2O3:Sn films backed by polyester foils. Current (I) 1/f noise was observed when the charged (colored) device was discharged via a resistor. The power spectral density Si at fixed frequency varied as S-i similar to I-2. Continuous coloration/bleaching degraded the optical quality and homogeneity of the device and led to a concomitant increase of the 1/f noise intensity, thus indicating that 1/f noise has the potential to serve as a quality measure for EC devices.

Place, publisher, year, edition, pages
2008. Vol. 17, no 2, 025005- p.
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Engineering and Technology
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URN: urn:nbn:se:uu:diva-110467DOI: 10.1088/0964-1726/17/2/025005ISI: 000254176300005OAI: oai:DiVA.org:uu-110467DiVA: diva2:277234
Available from: 2009-11-16 Created: 2009-11-16 Last updated: 2017-12-12Bibliographically approved

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Granqvist, Claes Göran

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