Soft x-ray free electron laser microfocus for exploring matter under extreme conditions
2009 (English)In: Optics Express, ISSN 1094-4087, Vol. 17, no 20, 18271-18278 p.Article in journal (Refereed) Published
We have focused a beam (BL3) of FLASH (Free-electron LASer in Hamburg: lambda = 13.5 nm, pulse length 15 fs, pulse energy 10-40 mu J, 5Hz) using a fine polished off-axis parabola having a focal length of 270 mm and coated with a Mo/Si multilayer with an initial reflectivity of 67% at 13.5 nm. The OAP was mounted and aligned with a picomotor controlled six-axis gimbal. Beam imprints on poly(methyl methacrylate) -PMMA were used to measure focus and the focused beam was used to create isochoric heating of various slab targets. Results show the focal spot has a diameter of <= 1 mu m. Observations were correlated with simulations of best focus to provide further relevant information.
Place, publisher, year, edition, pages
2009. Vol. 17, no 20, 18271-18278 p.
Engineering and Technology
IdentifiersURN: urn:nbn:se:uu:diva-111992DOI: 10.1364/OE.17.018271ISI: 000270295300112ISBN: 1094-4087OAI: oai:DiVA.org:uu-111992DiVA: diva2:284256