uu.seUppsala University Publications
Change search
CiteExportLink to record
Permanent link

Direct link
Cite
Citation style
  • apa
  • ieee
  • modern-language-association
  • vancouver
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf
Temperature dependence and dielectric properties of dominant low-frequency noise sources in SiGe HBT
Uppsala University, Disciplinary Domain of Science and Technology, Technology, Department of Engineering Sciences.
2000 (English)In: IEEE Transactions on Electron Devices, ISSN 0018-9383, E-ISSN 1557-9646, Vol. 47, no 5, 1107-1112 p.Article in journal (Refereed) Published
Place, publisher, year, edition, pages
2000. Vol. 47, no 5, 1107-1112 p.
National Category
Engineering and Technology
Identifiers
URN: urn:nbn:se:uu:diva-114361DOI: 10.1109/16.841247OAI: oai:DiVA.org:uu-114361DiVA: diva2:293827
Available from: 2010-02-14 Created: 2010-02-14 Last updated: 2017-12-12Bibliographically approved

Open Access in DiVA

No full text

Other links

Publisher's full text
By organisation
Department of Engineering Sciences
In the same journal
IEEE Transactions on Electron Devices
Engineering and Technology

Search outside of DiVA

GoogleGoogle Scholar

doi
urn-nbn

Altmetric score

doi
urn-nbn
Total: 416 hits
CiteExportLink to record
Permanent link

Direct link
Cite
Citation style
  • apa
  • ieee
  • modern-language-association
  • vancouver
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf