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Sacrificial Tamper Slows Down Sample Explosion in FLASH Diffraction Experiments
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2010 (English)In: Physical Review Letters, ISSN 0031-9007, Vol. 104, no 6, 064801- p.Article in journal (Refereed) Published
Abstract [en]

Intense and ultrashort x-ray pulses from free-electron lasers open up the possibility for near-atomic resolution imaging without the need for crystallization. Such experiments require high photon fluences and pulses shorter than the time to destroy the sample. We describe results with a new femtosecond pump-probe diffraction technique employing coherent 0.1 keV x rays from the FLASH soft x-ray free-electron laser. We show that the lifetime of a nanostructured sample can be extended to several picoseconds by a tamper layer to dampen and quench the sample explosion, making <1 nm resolution imaging feasible.

Place, publisher, year, edition, pages
2010. Vol. 104, no 6, 064801- p.
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Physical Sciences
URN: urn:nbn:se:uu:diva-137552DOI: 10.1103/PhysRevLett.104.064801ISI: 000274445100017OAI: oai:DiVA.org:uu-137552DiVA: diva2:378482
Available from: 2010-12-15 Created: 2010-12-15 Last updated: 2014-09-26Bibliographically approved

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Seibert, M. Marvin
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