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X-ray reflection, a technique for measuring sputtering yields of thin film
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1994 (English)In: Nuclear Instruments and Methods in Physics Research Section B:: Beam Interactions with Materials and Atoms, Vol. 94, no 4, 395-403 p.Article in journal (Refereed) Published
Place, publisher, year, edition, pages
1994. Vol. 94, no 4, 395-403 p.
URN: urn:nbn:se:uu:diva-10836OAI: oai:DiVA.org:uu-10836DiVA: diva2:38604
Available from: 2007-04-25 Created: 2007-04-25 Last updated: 2011-01-16

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Katardjiev, Ilia
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