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Fabrication and characterization of highly reproducible, high resistance nanogaps made by focused ion beam milling
Uppsala University, Disciplinary Domain of Science and Technology, Technology, Department of Engineering Sciences, Applied Materials Sciences.
Uppsala University, Disciplinary Domain of Science and Technology, Technology, Department of Engineering Sciences, Nanotechnology and Functional Materials.
Uppsala University, Disciplinary Domain of Science and Technology, Technology, Department of Engineering Sciences, Nanotechnology and Functional Materials.ORCID iD: 0000-0002-5496-9664
Uppsala University, Disciplinary Domain of Science and Technology, Technology, Department of Engineering Sciences, Applied Materials Sciences.
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2007 (English)In: Nanotechnology, ISSN 0957-4484, E-ISSN 1361-6528, Vol. 18, no 28, 285301- p.Article in journal (Refereed) Published
Abstract [en]

Nanoelectrodes were fabricated combining photolithography, electron beam lithography and focused ion beam milling allowing for large scale integration and nanoengineering of the electrode properties. The structure determination by transmission and scanning electron microscopy showed a highly reproducible gap width. The atomic scale electrode structure was characterized using scanning and transmission electron microscopy. The nanogap resistances were found to be the highest hitherto reported for nanogaps, namely in the 300–1300 TΩ range. Gold nanoparticles were trapped by ac dielectrophoresis, and the electrodes were shown to be stable enough to endure empty gap voltages as high as 5 V as well as currents high enough to induce fusing of trapped nanoparticles.

Place, publisher, year, edition, pages
2007. Vol. 18, no 28, 285301- p.
National Category
Engineering and Technology
Research subject
Engineering Science with specialization in Nanotechnology and Functional Materials
Identifiers
URN: urn:nbn:se:uu:diva-11214DOI: 10.1088/0957-4484/18/28/285301ISI: 000247619000001OAI: oai:DiVA.org:uu-11214DiVA: diva2:38982
Available from: 2007-11-15 Created: 2007-11-15 Last updated: 2017-12-11Bibliographically approved
In thesis
1. Fabrication and Applications of a Focused Ion Beam Based Nanocontact Platform for Electrical Characterization of Molecules and Particles
Open this publication in new window or tab >>Fabrication and Applications of a Focused Ion Beam Based Nanocontact Platform for Electrical Characterization of Molecules and Particles
2010 (English)Doctoral thesis, comprehensive summary (Other academic)
Abstract [en]

The development of new materials with novel properties plays an important role in improving our lives and welfare. Research in Nanotechnology can provide e.g. cheaper and smarter materials in applications such as energy storage and sensors. In order for this development to proceed, we need to be able to characterize the material properties at the nano-, and even the atomic scale. The ultimate goal is to be able to tailor them according to our needs.

One of the great challenges concerning the characterization of nano-sized objects is how to achieve the physical contact to them. This thesis is focused on the contacting of nanoobjects with the aim of electrically characterizing them and subsequently understanding their electrical properties. The analyzed nanoobjects are carbon nanosheets, nanotetrapods, nanoparticles and molecular systems.

Two contacting strategies were employed in this thesis. The first strategy involved the development of a focused ion beam (FIB) based nanocontact platform. The platform consists of gold nanoelectrodes, having nanogaps of 10-30 nm, on top of an insulating substrate. Gold nanoparticles, double-stranded DNA and cadmium telluride nanotetrapods have been trapped in the gaps by using dielectrophoresis. In certain studies, the gold electrodes have also been coated with conducting or non-conducting molecules, prior to the trapping of gold nanoparticles, in order to form molecular junctions. These junctions were subsequently electrically characterized to evaluate the conduction properties of these molecular systems. For the purpose of better controlling the attachment of molecules to the nanoelectrodes, a novel route to synthesize alkanedithiol coated gold nanoparticles was developed. The second contacting strategy was based on the versatility of the FIB instrument as a platform for in-situ manipulation and electrical characterization of non-functionalized and functionalized carbon nanosheets, where it was found that the functionalized samples had an increased conductivity by more than one order of magnitude.

Both contacting strategies proved to be valuable for building knowledge around contacting and electrical characterization of nanoobjects

Place, publisher, year, edition, pages
Uppsala: Acta Universitatis Upsaliensis, 2010. 88 p.
Series
Digital Comprehensive Summaries of Uppsala Dissertations from the Faculty of Science and Technology, ISSN 1651-6214 ; 745
Keyword
Focused Ion Beam, FIB, Scanning Electron Microscopy, SEM, Nanogap electrodes, Nanostructuring, Nanofabrication, Electron Beam Lithography, Electrical characterization, Dielectrophoresis
Identifiers
urn:nbn:se:uu:diva-122940 (URN)978-91-554-7809-4 (ISBN)
Public defence
2010-06-07, Polhemsalen, Ångströmlaboratoriet, Lägerhyddsvägen 1, 75121, Uppsala, 10:15 (English)
Opponent
Supervisors
Available from: 2010-05-17 Created: 2010-04-21 Last updated: 2010-05-18Bibliographically approved

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Blom, TobiasWelch, KenStrömme, MariaCoronel, ErnestoLeifer, Klaus

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