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Characteristics of focused soft X-ray free-electron laser beam determined by ablation of organic molecular solids
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2007 (English)In: Optics Express, ISSN 1094-4087, Vol. 15, no 10, 6036-6043 p.Article in journal (Refereed) Published
Abstract [en]

A linear accelerator based source of coherent radiation, FLASH (Free-electron LASer in Hamburg) provides ultra-intense femtosecond radiation pulses at wavelengths from the extreme ultraviolet (XUV; lambda< 100nm) to the soft X-ray (SXR; lambda<30nm) spectral regions. 25-fs pulses of 32-nm FLASH radiation were used to determine the ablation parameters of PMMA - poly ( methyl methacrylate). Under these irradiation conditions the attenuation length and ablation threshold were found to be (56.9 +/- 7.5) nm and similar to 2 mJ center dot cm(-2), respectively. For a second wavelength of 21.7 nm, the PMMA ablation was utilized to image the transverse intensity distribution within the focused beam at mu m resolution by a method developed here.

Place, publisher, year, edition, pages
2007. Vol. 15, no 10, 6036-6043 p.
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Physical Sciences Biological Sciences
URN: urn:nbn:se:uu:diva-144647DOI: 10.1364/OE.15.006036ISI: 000246474300016OAI: oai:DiVA.org:uu-144647DiVA: diva2:394011
Available from: 2011-02-01 Created: 2011-02-01 Last updated: 2016-04-12Bibliographically approved

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Caleman, Carl
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