Characteristics of focused soft X-ray free-electron laser beam determined by ablation of organic molecular solids
2007 (English)In: Optics Express, ISSN 1094-4087, Vol. 15, no 10, 6036-6043 p.Article in journal (Refereed) Published
A linear accelerator based source of coherent radiation, FLASH (Free-electron LASer in Hamburg) provides ultra-intense femtosecond radiation pulses at wavelengths from the extreme ultraviolet (XUV; lambda< 100nm) to the soft X-ray (SXR; lambda<30nm) spectral regions. 25-fs pulses of 32-nm FLASH radiation were used to determine the ablation parameters of PMMA - poly ( methyl methacrylate). Under these irradiation conditions the attenuation length and ablation threshold were found to be (56.9 +/- 7.5) nm and similar to 2 mJ center dot cm(-2), respectively. For a second wavelength of 21.7 nm, the PMMA ablation was utilized to image the transverse intensity distribution within the focused beam at mu m resolution by a method developed here.
Place, publisher, year, edition, pages
2007. Vol. 15, no 10, 6036-6043 p.
Physical Sciences Biological Sciences
IdentifiersURN: urn:nbn:se:uu:diva-144647DOI: 10.1364/OE.15.006036ISI: 000246474300016OAI: oai:DiVA.org:uu-144647DiVA: diva2:394011