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Sample preserving deep interface characterization technique
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2006 (English)In: Physical Review Letters, ISSN 0031-9007, E-ISSN 1079-7114, Vol. 97, no 26, 266106Article in journal (Refereed) Published
Abstract [en]

We propose a nondestructive technique based on atomic core-level shifts to characterize the interface quality of thin film nanomaterials. Our method uses the inherent sensitivity of the atomic core-level binding energies to their local surroundings in order to probe the layer-resolved binary alloy composition profiles at deeply embedded interfaces. From an analysis based upon high energy x-ray photoemission spectroscopy and density functional theory of a Ni/Cu fcc (100) model system, we demonstrate that this technique is a sensitive tool to characterize the sharpness of a buried interface. We performed controlled interface tuning by gradually approaching the diffusion temperature of the multilayer, which lead to intermixing. We show that core-level spectroscopy directly reflects the changes in the electronic structure of the buried interfaces, which ultimately determines the functionality of the nanosized material.

Place, publisher, year, edition, pages
2006. Vol. 97, no 26, 266106
National Category
Condensed Matter Physics
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URN: urn:nbn:se:uu:diva-146644DOI: 10.1103/PhysRevLett.97.266106ISI: 000243167300029OAI: oai:DiVA.org:uu-146644DiVA: diva2:399174
Available from: 2011-02-21 Created: 2011-02-18 Last updated: 2017-12-11Bibliographically approved

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Karis, OlofÖhrwall, GunnarAndersson, GabriellaMarcellini, Moreno

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