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A non-destructive deep interface characterization technique for multilayer films
Uppsala University, Disciplinary Domain of Science and Technology, Physics, Department of Physics, Physics V.
Uppsala University, Disciplinary Domain of Science and Technology, Physics, Department of Physics, Physics V.
Uppsala University, Disciplinary Domain of Science and Technology, Physics, Department of Physics, Physics V.
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2007 (English)In: Journal of Electron Spectroscopy and Related Phenomena, ISSN 0368-2048, E-ISSN 1873-2526, Vol. 156, LII-LII p.Article in journal (Refereed) Published
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2007. Vol. 156, LII-LII p.
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URN: urn:nbn:se:uu:diva-147299OAI: oai:DiVA.org:uu-147299DiVA: diva2:400147
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Times Cited: 0 10th International Conference on Electronic Spectroscopy and Structure Aug 28-sep 01, 2006 Foz do Iguacu, BRAZILAvailable from: 2011-02-24 Created: 2011-02-24 Last updated: 2017-12-11

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