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Quality Assessments of Electrochromic Devices: The possible use of 1/f current noise
Gdańsk University of Technology.
Texas A&M University.
Uppsala University, Disciplinary Domain of Science and Technology, Technology, Department of Engineering Sciences, Solid State Physics.
2007 (English)In: Ionics (Kiel), ISSN 0947-7047, E-ISSN 1862-0760, Vol. 13, no 3, 179-182 p.Article in journal (Refereed) Published
Abstract [en]

Electrochromic (EC) devices, capable of modulating their optical transmittance by charge insertion/extraction, were produced by laminating films comprised of nanoporous W oxide and Ni–V oxide by a polymer electrolyte and having this three-layer stack between transparent conducting In2O3:Sn films backed by polyester foils. 1/f noise in the current (I) was observed when the charged (colored) EC device was discharged via a resistor. The power spectral density S i at fixed frequency scaled as S i ∼ I 2. Extended color/bleach cycling degraded the optical quality and homogeneity of the device and concomitantly increased the 1/f noise intensity. These initial data indicate that 1/f noise has a potential to serve as a quality measure for EC devices.

Place, publisher, year, edition, pages
2007. Vol. 13, no 3, 179-182 p.
Keyword [en]
Electrochromics, 1/f noise, Tungsten oxide, Nickel oxide, Durability
National Category
Engineering and Technology
URN: urn:nbn:se:uu:diva-14456DOI: 10.1007/s11581-007-0088-9ISI: 000248879000013OAI: oai:DiVA.org:uu-14456DiVA: diva2:42226
Available from: 2008-01-30 Created: 2008-01-30 Last updated: 2011-01-27Bibliographically approved

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Granqvist, Claes G.
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