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Investigation of Ti2AlC and TiC by soft x-ray emission spectroscopy
Uppsala University, Disciplinary Domain of Science and Technology, Physics.
2007 (English)In: Proceedings of the international conference on nanoscience and technology / [ed] Meyer E., Hegner M., Gerber C., Guntherodt H.J., 2007, Vol. 61, 760-764 p.Conference paper, Published paper (Other academic)
Abstract [en]

The electronic structure of the MAX-phase Ti2AlC was investigated by soft x-ray emission spectroscopy. This nanolaminated carbide compound represents a class of layered materials with a combination of properties from both metals and ceramics. The bulk-sensitive soft x-ray emission technique is shown to be particularly useful for detecting detailed electronic structure information about internal monolayers and interfaces. The Ti-Al bonding is manifested by a pronounced peak in the Ti L-emission of Ti2AlC, which is not present in the binary TiC system. The spectral shape of Al L-emission in the MAX-phase is strongly modified in comparison to metallic Al. By replacing the constituting elements, a change of the electron population can be achieved causing a change of covalent bonding between the laminated layers, which enables control of the macroscopic properties of the material.

Place, publisher, year, edition, pages
2007. Vol. 61, 760-764 p.
Series
Journal of Physics: Conference Series, ISSN 1742-6588 ; 61
National Category
Natural Sciences
Identifiers
URN: urn:nbn:se:uu:diva-155693DOI: 10.1088/1742-6596/61/1/152ISI: 000291445400152OAI: oai:DiVA.org:uu-155693DiVA: diva2:427758
Conference
International Conference on Nanoscience and Technology Basel, Switzerland, Jul 30-Aug 04, 2006
Available from: 2011-06-28 Created: 2011-06-28 Last updated: 2011-06-28Bibliographically approved

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