GenX: an extensible X-ray reflectivity refinement program utilizing differential evolution
2007 (English)In: Journal of applied crystallography, ISSN 0021-8898, E-ISSN 1600-5767, Vol. 40, no 6, 1174-1178 p.Article in journal (Refereed) Published
GenX is a versatile program using the differential evolution algorithm for fitting X-ray and neutron reflectivity data. It utilizes the Parratt recursion formula for simulating specular reflectivity. The program is easily extensible, allowing users to incorporate their own models into the program. This can be useful for fitting data from other scattering experiments, or for any other minimization problem which has a large number of input parameters and/or contains many local minima, where the differential evolution algorithm is suitable. In addition, GenX manages to fit an arbitrary number of data sets simultaneously. The program is released under the GNU General Public License.
Place, publisher, year, edition, pages
2007. Vol. 40, no 6, 1174-1178 p.
X-ray reflectivity, neutron reflectivity, differential evolution algorithm, genetic algorithm
IdentifiersURN: urn:nbn:se:uu:diva-16430DOI: 10.1107/S0021889807045086ISI: 000250895200025OAI: oai:DiVA.org:uu-16430DiVA: diva2:44201