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A novel spectroscopy: X-ray magneto-optical spectroscopy of buried antiferromagnetic films-Theory and experiment
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2002 (English)In: Highlights of the Leibniz-Institute Dresden, 7-10 p.Article, review/survey (Other (popular science, discussion, etc.)) Published
Abstract [en]

X-ray magneto-optical (MO) spectroscopies have developed into extremelypowerful tools for the investigation of both fundamental and applied magnetism.In particular the x-ray magnetic circular dichroism (XMCD) has become widelyused during the last decade. A disadvantage of the XMCD and related techniquesis that these can be applied only to study ferromagnetic (FM) materials. Thereexists currently an increasing interest in antiferromagnetic (AFM) materialswhich call for different x-ray spectroscopic techniques. A novel, versatilemagneto-x-ray spectroscopy has been developed, that can be applied to AFM’s.This magneto-x-ray spectroscopy may be measured in reflection and is relatedto the x-ray Voigt effect and the x-ray magnetic linear dichroism (XMLD), whichboth involve a transmission geometry. Using the newly developed technique,element-selective x-ray MO spectra of AFM materials have been measured forthe first time in reflection. The XMLD-type reflection spectroscopy has beenapplied to buried AFM layers, which was demonstrated by spectra obtained fromexchange-biased microstructures of current technological importance: NiO/Coand NiMn/Co, containing the insulating AFM NiO, and the metallic AFM NiMn,respectively. The measured spectrum provides information about the exchangesplitd-density of states of the AFM atom.

Place, publisher, year, edition, pages
2002. 7-10 p.
National Category
Physical Sciences
Identifiers
URN: urn:nbn:se:uu:diva-21741OAI: oai:DiVA.org:uu-21741DiVA: diva2:49514
Available from: 2007-01-03 Created: 2007-01-03 Last updated: 2014-01-29Bibliographically approved

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Oppeneer, Peter M.

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