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Fine structure of K-absorption limit of silicon oxide
Uppsala University, Disciplinary Domain of Humanities and Social Sciences, Faculty of Philosophy, Mathematics and Science Section.
1930 (English)In: Nature, ISSN 0028-0836, Vol. 125, 777-778 p.Article in journal, Letter (Refereed) Published
Abstract [en]

THAT the X-ray absorption limits are not simple but show a rather complicated structure has been known now for some time. The main difficulties in their experimental investigation are in respect of (1) amount of the absorbing substance, and (2) dispersion of the spectrograph. The amount of the absorber must not be either too great or too small, otherwise the details are lost. Secondly, the dispersion must be made as large as possible to bring out all the details and measure them with the usual accuracy.

Place, publisher, year, edition, pages
1930. Vol. 125, 777-778 p.
National Category
Physical Sciences
URN: urn:nbn:se:uu:diva-172082DOI: 10.1038/125777a0ISI: 000188314800204OAI: oai:DiVA.org:uu-172082DiVA: diva2:513373
Available from: 2012-04-02 Created: 2012-04-02 Last updated: 2012-07-05Bibliographically approved

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