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Uncertainties in the determination of thermal emissivity by measurement of reflectance using Fourier transform spectrometers
Uppsala University, Disciplinary Domain of Science and Technology, Technology, Department of Engineering Sciences, Solid State Physics. Fasta tillståndets fysik.
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2006 (English)In: Thin Solid Films, no 502, 164-169 p.Article in journal (Refereed) Published
Place, publisher, year, edition, pages
2006. no 502, 164-169 p.
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Engineering and Technology
URN: urn:nbn:se:uu:diva-25545OAI: oai:DiVA.org:uu-25545DiVA: diva2:53319
Available from: 2007-02-13 Created: 2007-02-13 Last updated: 2016-07-12

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Roos, ArneGelin, K
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